Transmission Electron Microscope

JEOL 2010F Transmission Electron Microscope

This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, with the ability to image lattice fringes at 0.14 nm resolution. It is a multipurpose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high-resolution image observation, nanoarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. With the addition of Energy dispersive X-ray spectrometer (EDS) and Parallel electron energy loss spectrometer (PEELS), the field-emission TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 2 nm in diameter.

Transmission Electron Microscope
  • 200 kV, Schottky Field Emission Gun
  • Ultra High Resolution Pole Piece (Cs=0.5 mm)
  • 0.19 nm Point-to-Point Resolution
  • Minimum Beam Size: 0.5 nm
  • JEOL Single Tilt Low Background Holder
  • JEOL Double Tilt Low Background Holder
  • Double Tilt Heating Holder (Maximum Temperature: 1000ºC)
  • Specimen Tilt Angle (X axis): ±20º
  • High Resolution Imaging
  • Convergent Beam Electron Diffraction (CBED)
  • Energy Dispersive X-Ray Analysis (EDS)
  • Electron Energy Loss Spectroscopy (EELS)

Standard Operating Procedure for the JEOL 2010F TEMÌý
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TEM Facility User Rates (Per Hour)

Ìý

External Commercial

(profit)

External Academic

(non-profit)

Internal

Ìý

Facility ÌýOperator

Self ÌýOperator

Facility ÌýOperator

Self Operator

Facility Operator

Self Operator

TEM

$250

$150

$160

$60

$140

$40


The microscope is located in Higgins 030. For all microscope questions and training, please contact:ÌýBret Judson.

Please note that all work performed in Ï㽶Ðã core facilities and recharge centers should always be appropriately acknowledged.Ìý If you are publishing or presenting data acquired in Ï㽶Ðã core facilities and recharge centers, please include the following statement in the Acknowledgement section of your manuscript/poster/presentation, "The authors would like to thank the Boston College <insert facility name> for assistance with the work presented in this paper/poster/presentation*."
* Delete as appropriate

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